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一种原位制备复杂结构样品中纳米级颗粒的TEM样品的方法 专利
专利类型: 发明专利, 专利号: CN202010556743.2, 申请日期: 2021-08-10,
Inventors:  李瑞;  李阳;  钟怡江;  李雄耀;  刘建忠;  王世杰
Favorite  |  View/Download:102/0  |  Submit date:2023/12/05
Method for Preparing Multiple TEM Thin Slice Samples from Micron-sized Single Particle In Situ 专利
专利类型: 国际专利, 专利号: NL20202025431, 申请日期: 2020-06-02,
Inventors:  LI Rui;  LI Yang;  H Jin;  LI Xiongyao;  S Wang
Favorite  |  View/Download:92/0  |  Submit date:2023/12/05