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Method for Preparing Multiple TEM Thin Slice Samples from Micron-sized Single Particle In Situ 专利
专利类型: 国际专利, 专利号: NL20202025431, 申请日期: 2020-06-02,
Inventors:  LI Rui;  LI Yang;  H Jin;  LI Xiongyao;  S Wang
Favorite  |  View/Download:92/0  |  Submit date:2023/12/05